Neagu, R., Golenev, S., Werner, L., Berner, C., Gilles, R., Révay, Z., Ziegele, L., Plomp, J., Märkisch, B., & Gernhäuser, R. (2024). 4D Tomography for Neutron Depth Profiling Applications. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1068, 169502. https://doi.org/10.1016/j.nima.2024.169502
Guo, S., Li, X., Zhang, Z., Xu, X., Wang, H., Zhao, C., & Gu, Y. (2023). Measurement of Nanoscale Film Thickness Using Neutron Depth Profiling Technique. ACS Applied Materials and Interfaces, 15(29), 35277–35285. https://doi.org/10.1021/acsami.3c04980
Back to the NDP Home Page