NDP References for 1997 - 1998

1998 Literature

Nickel aluminide thin film fabrication via ion beam sputtering of compound targets, S.C. McGuire and J.D. Sulcer, Surface and Coatings Technology, Volumes 100-101, March 1998, Pages 362-365

Rutherford backscattering of laterally heterogeneous structures: The determination of radial density distributions in ion tracks in collodium, D. Fink, M. Müller, P. Szimkoviak, R. Klett, J. Vacik, V. Hnatowicz and L. T. Chadderton, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 134, Issue 1, January 1998, Pages 87-97

Prompt nuclear analytical techniques for material research in accelerator driven transmutation technologies: Prospects and quantitative analyses, J. Vacík, V. Hnatowicz, J. Cervená, V. Pe ina, R. Mach and I. Peka, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 139, Issues 1-4, April 1998, Pages 264-267

RBS measurement of depth profiles of erbium incorporated into lithium niobate for optical amplifier applications, Vratislav Pe ina,Ji í Vacík, Vladimír Hnatovicz, Jarmila ervená, Pavla Kolá ová, Jarmila pirková-Hradilová and Josef Schröfel, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 139, Issues 1-4, April 1998, Pages 208-212

LiNbO₃ exposed to radio-frequency plasma, H. Turcicova, J. Vacik, J. Cervena, V. Perina, M. Polcarova, J. Bradler, V. Zelezny and J. Zemek, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 141, Issues 1-4, May 1998, Pages 494-497

Plasma processing of LiNbO3 in a hydrogen/oxygen radio-frequency discharge, H Turcicová, V Perina, J Vacík, J Cervená, J Zemek, V Zelezný and H Arend, 0022-3727 31 (1998) pp.1052-1059

doi:10.1088/0022-3727/31/9/004

Neutron depth profiling study of lithium niobate optical waveguides, P. Kolá ova, J. Vacík, J. pirková-Hradilová and J. ervená, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 141, Issues 1-4, May 1998, Pages 498-500

On anomalous concentration depth profiles of atoms implanted into polymers, V. Hnatowicz, J. Vacík, J. Cervena, V. Pe ina, V. vorcík and V. Rybka, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volumes 136-138, 2 March 1998, Pages 568-573

Doping of ion irradiated poly(aryl ether ether ketone) from water solution of LiCl, V. Sˇvorcˇík, V. Rybka, J. Vacík, V. Hnatowicz and Y. Kobayashi, Polymer Degradation and Stability, Volume 62, Issue 3, December 1998, Pages 535-540

Ion transmission – new technique for analysis of ion tracks in polymers, J. Vacik, J. Cervena, V. Hnatowicz, D. Fink, P. Yu. Apel and P. Strauss Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 146, Issues 1-4, 2 December 1998, Pages 475-479

Transport processes during the incubation time of ion track etching in polymers, D. Fink, S. Ghosh, R. Klett, K. K. Dwivedi, Y. Kobayashi, K. Hirata, J. Vacik, V. Hnatowicz, J. Cervena and L. T. Chadderton, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 146, Issues 1-4, 2 December 1998, Pages 486-490

Study of LiOH etching of polyethyleneterephtalate irradiated with 11.4 MeV/amu Pb ions by neutron depth profiling and alpha particle transmission, J. Vacík, J. Cervená, V. Hnatowicz, D. Fink and P. Strauss, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 146, Issues 1-4, 2 December 1998, Pages 509-512

Pulse-shape discrimination in neutron depth profiling technique, J. Vacík, J. Cervená, V. Hnatowicz, V. Havránek, J. Hoffmann, S. Po ta, D. Fink and R. Klett, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 142, Issue 3, July 1998, Pages 397-401

Damage profile examination on ion irradiated peek by ⁶Li doping and neutron depth profiling technique, J. Vacík, J. ervená, V. Hnatowicz, V. vor ík, Y. Kobayashi, D. Fink and R. Klett, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 141, Issues 1-4, May 1998, Pages 216-222

On the uptake of aqueous tracer solutions by pristine and ion-irradiated PEEK, D. Fink, J. Vacik, J. Cervena, V. Hnatowicz, Y. Kobayashi, S. Hishita, S. Ghosh and R. Klett , Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 134, Issue 1, January 1998, Pages 61-72

Lithium Implantation into Fullerite, D. Fink, S. Ghosh, R. Klett, L. Palmetshofer, J. Vacik, V. Hnatowicz, J. Cervena, J. Kaschny, F. C. Zawislak, P. Sanchez, and M. Behar, Fullerene Science and Technology, Volume 6, Issue 4, (1998) pages 629-637

DOI:10.1080/10641229809350224

Recent Developments in Neutron Depth Profiling at NIST," Lamaze, G.P., Chen-Mayer, H.H., and Langland, J.K., in: Proc. 1998 International Conference on Characterization and Metrology for Ultra Large Scale Integration Technology, D.G. Seiler, W.M. Bullis, A. Diebold, R. McDonald, T. Shaffner (eds.), AIP Press, Woodbury, NY, 883, 1998

Development of a titanium nitride thin film standard, Steel, E; Deslattes, R; Pedulla, J; Lamaze, G; Greenherg, R; Armstrong, J Advanced Interconnects and Contact Materials and Processes for Future Integrated Circuits as held at the 1998 MRS Spring Meeting; San Francisco, CA; USA; 13-16 Apr. 1998. 505 pp. 1999

A study on boron diffusion in high density polyethylene using (n,a) reaction, P.A.Dokhale, P.R.Vijayaraghavan, V.N.Bhoraskar. Material Science and Engineering , B, 1, 57,1998

Design and Construction of the Facility for Neutron Depth Profiling in Research Reactor RECH-1, Octavio Mutis P., Gustavo Navarro A., Carlos Henríquez A. Claudio Pereda B. (1998)1-3 (references: http://cabierta.uchile.cl/revista/17/articulos/pdf/paper1.pdf and http://cabierta.uchile.cl/revista/17/articulos/paper1/index.html)

Design and Construction of An Analitical Instruments for Neutron Depth Profiling, Mutis, O. Venegas, R., NUCLEOTECNICA, Vol. 18; No. 32, 1998, pages 73-80 (in Spanish)

Depth distribution of boron determined by slow neutron induced lithium ion emission, Huaiyu H Chen-Mayer, George P Lamaze, Nuclear Instruments and Methods in Physics Research (B) Vol. 135 (1-4) pp. 407-412 February (1998)

1997 Literature

Doping of polyethyleneterephtalate modified by 150 keV Ar+ion bombardement with anorganic agents, V. Hnatowicz,V. Hnatowicz, J. Vacík, J. Červená, V. Švorčík, V. Rybka, D. Fink and R. Klett,, Radiation Measurements, Volume 28, Issues 1-6, (1997), Pages 777-780

Doping of Ion Irradiated Polyethylenterephtalate from Water Solution of LiCl, V. Hnatowicz, J. Vacík, J. Červená, V. Švorčík, V. Rybka, D. Fink and R. Klett, Physica Status Solidi (a) Volume 159, Issue 2, pages 327–333, February (1997)

Concentration and Depth Measurements of Boron in Semiconductor Materials Using Neutron Depth Profiling, Unlu, K., Wehring, B.W., Hossain, T.Z., Lowell, J.K., PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, Issue 3322 (1997) pages 458-469

Neutron Depth Profiling with the New NIST Cold Neutron Source, Lamaze, G.P., Chen-Mayer, H., Langland, J.K., and Downing, R.G., Surface and Interface Analysis, 25 (1997) 217-220

Alpha Radiation Damage in Plutonium Encapsulating Materials, K. Unlu, M. Saglam, C. Rios-Martinez, R. R. Hart, J. D. Shipp, Transactions of the Topical Conference on Plutonium and Actinides, Santa Fe, NM 25-27 August (1997) LA13338-C, pages 123-124

An old-new tool for nuclear analysis: Time-of-Flight Spectrometry. Schweikert, E.A., Welsh Jr., J. F., Journal of Radioanalytical and Nuclear Chemistry, Vol. 215, No. 1(1997) pages 23-30

Neutron depth profiling of elemental concentration using a focused beam, Huaiyu H. Chen-Mayer, G. P. Lamaze, David F. R. Mildner, Robert G. Downing, Proceedings of SPIE -- Vol. 2867, International Conference Neutrons in Research and Industry, George Vourvopoulos, Editor, February 1997, pp. 140-143

Neutron Depth Profiling, O. Mutis, Nucleotécnica, Vol. 17, No. 31 (1997) 69-80

Neutron depth profiling applications at The University of Texas research reactor, K. Ünlü and B. W. Wehring, Journal of Radioanalytical and Nuclear Chemistry, Volume 217, Number 2, pages 273-278 (1997)

High fluence boron implantation into polymers, J. Vacik, J. Cervena, D. Fink, R. Klett, V. Hnatowicz, V. Popok & V. Odzhaev (1997) Radiation Effects and Defects in Solids, vol. 143 No.2, pp 139-156 (1997)

DOI: 10.1080/10420159708212955 (link)

Neutron depth profiling measurements for implanted boron-10 characterization in semiconductor materials, Uenlue, K., Saglam, M., and Wehring, B.W., Transactions of the American Nuclear Society; Journal Volume: 77; Conference: 1997 American Nuclear Society (ANS) winter meeting, Albuquerque, NM (United States), 16-20 Nov 1997

ISSN 0003-018X